Micro resolution chart for CT – JIMA RT CT-01 available from X-RAY WorX

17. March 2015

As of now, customers can order the new JIMA resolution test chart RT CT-01  of Japan Inspection Instruments Manufacturers’ Association from X-RAY WorX. The new test chart is recommended for validating the performance of microfocus computed tomography (CT) systems during calibration, alignment, setup, and after maintenance.

Most advanced technology of semiconductor processing enabled development of the new resolution chart for computed tomography (CT) systems. The JIMA resolution test chart RT CT-01 provides 5 test areas with the familiar T-shape arrangement of black lines and white spaces.

If you are interested in the new JIMA resolution test chart RT CT-01, send an e-mail to service@x-ray-worx.com. We are pleased to submit a quote to you as soon as possible.


JIMA RT CT-01 chip and protection case


JIMA RT CT-01 Layout