New JIMA resolution test chart RT RC-04 available

21. January 2014

As of now, customers can order the new JIMA resolution test chart RT RC-04 of Japan Inspection Instruments Manufacturers’ Association from X-RAY WorX. The new test chart is recommended for validating the maximum resolution of microfocus and nano-resolution X-ray systems.

The JIMA resolution test chart RT RC-04 provides 23 test areas with typical T-shape arrangement of black lines and white spaces. Using RT RC-04, resolutions between 0.1 microns (µm) and 10 microns (µm) can be verified, which approximately correspond to focal spot sizes between 0.2 µm und 20 µm. The new test chart particularly considers latest requirements of semiconductor industry. It is suited for validating and calibrating nano-resolution and microfocus X-ray inspection systems, which are typically applied in this industrial sector.

If you are interested in the new JIMA resolution test chart RT RC-04, send an e-mail to We are pleased to submit a quote to you as soon as possible. Of course you can still order the JIMA-resolution test charts RT RC-05 and RT RC-02B.


JIMA resolution test RT RC-04